1. Thing Thing 2fun In Ict Igcse
2. Thing Thing 2fun In Ict Technology
3. Thing Thing 2fun In Ict Project

Use this form to submit links to add to the list above (the webmaster will check the link before publication) Heading: Address. Moved Permanently. The document has moved here. Information and communications technology (ICT) skills refer to one’s ability to converse with people through various technologies. Similar to information technology (IT), ICT refers to technology use for regular, everyday tasks: sending an email, making a video call, searching the internet, using a tablet or mobile phone, and more.

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During in-circuit tests (ICT) all components on the PCB are measured. In doing so, defective components are detected and can be replaced accordingly.

Function tests (FCT) check the entire intended function of a PCB. According to the intended area of use, the environment is replicated and the electrical performance of the PCB is checked.

In order to optimally fulfill the contacting requirements, various test probes are available. These differ in terms of installation height, grid size (possible distance between probes), tip style, and type of connection – see following illustration. The electrical connection is achieved either with a solder cup or wire-wrap, with or without cable (wireless).

Contacting loaded PCBs

• Standard PIN und PAD contacting
• Dual-stage contacting
• Limited space available
• Contacting of contaminated surfaces
• Contacting of beads on the PCB
• Connection without cable
• Small pads and grids
• Robust probes for harsh conditions

Depending on the PCB to be contacted, and the ambient conditions, INGUN offers a variety of test probes:

International standard spring-loaded test probes (GKS) (inch)
Available in two different versions: Standard working stroke (4.3 mm) and longer working stroke (9.3 mm) for dual-stage test fixtures to combine ICT and FCT. Wireless receptacles enable the wireless connection of test probes using a transfer PCB.

Thing Thing 2fun In Ict Igcse

e-type®
Test probes have a higher preload in comparison to standard test probes.
This initial higher spring force guarantees a secure contact at the same final load (the spring force is equal to that of the comparable standard test probe at working stroke).

Rotating test probes
Can provide a reliable alternative if contacting problems occur. A rotating movement during the stroke process scratches the surface to be contacted, thus insulating layers are securely penetrated.

Bead test probes
Are used to contact beads on PCBs. A variety of tip styles are available depending on the beads.

Thing Thing 2fun In Ict Technology

Fine-pitch test probes
Are used to contact very small test point in small grids. These are sometimes mounted without receptacles.

Metric test probes (metric standard)

Thing Thing 2fun In Ict Project

In addition to the classic ICT/FCT test probes without collars, the metric standard test probes stand out due to their stability and robustness and all feature a pronounced collar.